Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
The MEMS-based Mx-FinePitch (Mx-FP) Probe Card addresses the ultra-fine-pitch testing needs of SOC and logic devices. Built for multi-DUT testing in high-volume production environments, the ...
Chunghwa Precision Test Tech (CHPT), an IC test interface solutions provider, is optimistic about demand spurred by AI servers and smartphones and projects a surge in probe card orders in the second ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results