Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

CRTs don’t last forever, and neither do the electronics that drive them. When you have a screen starting to go wonky, then you need a way to troubleshoot which is at fault. A great tool for that is a ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Many digital-communications systems use non-return-to-zero (NRZ) signaling, and system designers have created many NRZ test patterns to test and verify their products. These patterns usually either ...

Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators are specifically designed to address this problem. Whatever ...

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...